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Real-time enhancement of defects in a periodic mask using photorefractive Bi12SiO20

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Abstract

The first known experimental results of real-time optical defect enhancement of a periodic mask are reported. A low-intensity reference wave interferes with the Fourier transform of an object beam to form a hologram in a photo-refractive crystal. The nonlinear properties of the crystal perform a filtering operation, and phase-conjugate readout results in a defect-enhanced image. Defects of size 10 μm × 100 μm have been easily detected with high signal-to-noise ratio, and a discussion of performance limitations is presented.

© 1985 Optical Society of America

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