Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Measurement of the complex polarizability of electron traps in Bi12SiO20 by a moving-grating technique

Not Accessible

Your library or personal account may give you access

Abstract

We measure the optical two-beam coupling gain in three nominally undoped cubic n-type Bi12SiO20 crystals as a function of the beam frequency difference Ω and the beam intensity. The crystal geometry is chosen so that the beam coupling through the ordinary photorefractive effect is absent. From the dependence of the gain on Ω, the full complex polarizability difference αfe between a full and an empty deep trap at the wavelength of 515 nm is deduced to be (−1.8 − 4.6i ± 0.7 ± 1.1i) × 10−39 F m2 in SI units or (−1.6 − 4.1i ± 0.6 ± 1.0i) × 10−23 cm3 in Gaussian units. This suggests that the hole photoexcitation cross section σh is larger than that for an electron, σe. Our data are consistent with the electron and hole parameters deduced from extensive previous measurements (in one of the crystals) analyzed with the standard electron–hole competition equations. This consistency requires that the average density of full traps be at least 20 times larger than the average density NA of empty traps and that σh be (2.4 ± 0.8) × 10−17 cm2, while NA is (1.4 ± 0.4) × 1016 cm−3 and σe is less than ~6 × 10−18 cm2. This is to our knowledge the first determination of these parameters in a sillenite crystal.

© 1993 Optical Society of America

Full Article  |  PDF Article
More Like This
Experimental comparison of the ac field and the moving-grating holographic-recording techniques for Bi12SiO20 and Bi12TiO20 photorefractive crystals

S. L. Sochava, E. V. Mokrushina, V. V. Prokof’ev, and S. I. Stepanov
J. Opt. Soc. Am. B 10(9) 1600-1604 (1993)

Two-wave mixing in photorefractive Bi12SiO20 fibers

Alexei A. Kamshilin, Raimo Silvennoinen, Timo Jaaskelainen, Claudio J. Lima, Marcello R. B. Andreeta, and Victor V. Prokofiev
Opt. Lett. 18(9) 690-692 (1993)

Continuous method for measuring the electro-optic coefficient in Bi12SiO20 and Bi12GeO20

P. Bayvel, M. McCall, and R. V. Wright
Opt. Lett. 13(1) 27-29 (1988)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (5)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved