Abstract

Two-wave mixing measurements made during the encoding of plasma gratings in AlGaAs:Te indicate that there is no phase shift between the illumination intensity pattern and the encoded refractive-index grating. These results support our previously proposed photorefractive mechanism, which is based on persistent plasma gratings and does not require charge transport.

© 1995 Optical Society of America

Thick plasma gratings using a local photorefractive effect in CdZnTe:In

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