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Detection of subwavelength Goos–Hänchen shifts from near-field intensities: a numerical simulation

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Abstract

We present an exact calculation of the frustrated total internal reflection of a beam at a dielectric interface in the presence of a dielectric near-field detecting tip. The possibility of measuring subwavelength Goos–Hänchen lateral shifts of highly focused beams is shown.

© 1995 Optical Society of America

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