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Molecular engineering of polymer films for amplitude and phase measurements of Ti:sapphire femtosecond pulses

D. R. Yankelevich, Philippe Prêtre, A. Knoesen, G. Taft, M. M. Murnane, H. C. Kapteyn, and R. J. Twieg

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Abstract

Using second-harmonic frequency-resolved optical gating and a tricyanovinylaniline polymer thin film, we have measured the amplitude and the phase of mode-locked Ti:sapphire laser pulses as short as 13 fs. These thin films are ideally suited for ultrashort-pulse diagnostics because they eliminate the angle tuning associated with birefringent phase-matched crystals, minimize pulse distortions introduced by group-velocity dispersion, and exhibit excellent photochemical stability.

© 1996 Optical Society of America

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