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Resonant photorefractive effect in InGaAs/GaAs multiple quantum wells

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Abstract

Semi-insulating InGaAs/GaAs multiple quantum wells are fabricated by metal-organic vapor-phase epitaxy and proton implantation. Two-wave mixing gain and four-wave mixing diffraction efficiency are measured at wavelengths of 0.910.94 μm in the Franz–Keldysh geometry. We observe a large photorefractive effect caused by the excitonic electro-optic effect. The maximum diffraction efficiency reaches 1.5×10-4.

© 1999 Optical Society of America

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