Abstract
We report a new spectroscopic technique to measure simultaneously the intensity and the phase of second-harmonic (SH) radiation over a broad spectral range without laser tuning. Temporally separated SH pulses from two sources, excited by the same broad-bandwidth 15-fs Ti:sapphire fundamental pulse, interfere in a spectrometer to yield frequency-domain interference fringes. We demonstrate the technique by measuring the strongly bias-dependent phase of SH radiation from a metal-oxide-semiconductor capacitor in the spectral range of the Si critical point.
© 1999 Optical Society of America
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