Abstract

${\mathrm{SrBi}}_2{\mathrm{Ta}}_2{\mathrm{O}}_9$ (SBT) thin films on quartz substrates were prepared by use of the pulsed-laser deposition technique. The nonlinear refractive indices, $n_2$, of the SBT films were measured by use of z-scan techniques with picosecond pulses. Large negative nonlinear refractive indices of 3.84 and $3.58 {\mathrm{cm}}^2/\mathrm{GW}$ were obtained for the wavelengths 532 nm and $1.064 \mu \mathrm{m}$, respectively. The two-photon absorption coefficient was determined to be 7.3 cm/GW for 532 nm. The limiting behavior of SBT thin film on a quartz substrate was investigated in an $f/5$ defocusing geometry by use of 38-ps-duration, 532-nm, $1.064‐\mu \mathrm{m}$ laser excitation.

© 2001 Optical Society of America

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