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Optical characterization of photonic crystal delay lines based on one-dimensional coupled defects

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Abstract

We performed optical characterizations of optical delay lines based on photonic crystal waveguides. The delay lines were composed of cylindrical air holes in silicon-on-silicon-dioxide ridge waveguides, defects were periodically created by means of increasing the separation of two neighboring air holes, and the structure was designed to have flat-transmittance impurity band. We clearly observed an impurity band with a bandwidth of 30 nm and a maximum transmittance of 0.5 at an operating wavelength of 1.55 µm. A 600-fs delay was confirmed with a 20µm-long delay line. A good agreement was confirmed between the experimental results and the calculations.

© 2002 Optical Society of America

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