Abstract
A wavelength-tuned signal-processing approach is proposed for enabling direct unambiguous temperature measurement in a free-space targeted single-crystal silicon carbide temperature sensor. The approach simultaneously exploits the fundamental Sellmeier equation-based wavelength-sensitive refractive index change in combination with the classic temperature-dependent refractive index change and the material thermal-expansion path-length change to encode chip temperature with wavelength. Presently, the technique is useful for fast coarse temperature measurement as demonstrated from room temperature to using a 10-peak count wavelength-tuned measurement with a total wavelength change. This coarse technique can be combined with the previously presented two-wavelength signal-processing temperature measurement approach to simultaneously deliver a wide temperature range and a high-resolution temperature sensor. Applications for the sensor range from power plants to materials processing facilities.
© 2008 Optical Society of America
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