Expand this Topic clickable element to expand a topic
Skip to content
Optica Publishing Group

Grating-based at-wavelength metrology of hard x-ray reflective optics

Not Accessible

Your library or personal account may give you access

Abstract

A mean of characterizing the tangential shape of a hard x-ray mirror is presented. Derived from a group of methods operating under visible light, its application in the x-ray domain using an x-ray absorption grating allows recovery of the mirror shape with nanometer accuracy and submillimeter spatial resolution. The method works with incoherent light, does not require any a priori information about the mirror characteristics and allows shape reconstruction of x-ray reflective optics under thermal and mechanical working conditions.

© 2012 Optical Society of America

Full Article  |  PDF Article
More Like This
At-wavelength metrology of hard X-ray mirror using near field speckle

Sebastien Berujon, Hongchang Wang, Simon Alcock, and Kawal Sawhney
Opt. Express 22(6) 6438-6446 (2014)

Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach

Peng Su, Yuhao Wang, James H. Burge, Konstantine Kaznatcheev, and Mourad Idir
Opt. Express 20(11) 12393-12406 (2012)

Ronchi test for characterization of nanofocusing optics at a hard x-ray free-electron laser

Daniel Nilsson, Fredrik Uhlén, Anders Holmberg, Hans M. Hertz, Andreas Schropp, Jens Patommel, Robert Hoppe, Frank Seiboth, Vivienne Meier, Christian G. Schroer, Eric Galtier, Bob Nagler, Hae Ja Lee, and Ulrich Vogt
Opt. Lett. 37(24) 5046-5048 (2012)

Cited By

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Figures (3)

You do not have subscription access to this journal. Figure files are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Equations (4)

You do not have subscription access to this journal. Equations are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Login to access Optica Member Subscription

Select as filters


Select Topics Cancel
© Copyright 2024 | Optica Publishing Group. All Rights Reserved