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Subpicosecond-time-domain reflectometry

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Abstract

We demonstrate a new method of optical time-domain reflectometry using subpicosecond pulses and nonlinear detection. The high-spatial-resolution (≃15-μm) temporal resolution and sensitivity put new limits on the size and nature of defects that can be detected, localized, and analyzed in optical fibers.

© 1981 Optical Society of America

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